14th Power Semiconductor Reliability Round Table (Free-Visioconference)

join the 14th Power Semiconductor Reliability Round Table, an online technical forum for engineers and researchers tackling the toughest challenges in Wide Bandgap (WBG) reliability testing.

Hosted in collaboration with ECPE e.V. and the Cluster of Power Electronics, this event brings together experts to share methodologies and insights critical to qualifying SiC and GaN power semiconductors.

What You’ll Gain:

• In-depth exploration of dynamic H3TRB, DRB, DGS, Power Cycling, and dynamic HTFB testing methodologies.
• Strategies to address the growing demands for lifetime modeling.
• Insights into evolving standards and practical approaches for defining binding test requirements.

This session is designed for engineers and technical leaders engaged in qualification and reliability testing of WBG semiconductors. Presentations will include real-world applications, emerging techniques, and discussions on overcoming current testing limitations. Please keep in mind that active participation is key to the success of this event, and we encourage you to share your insights through a brief presentation.