{"id":2721,"date":"2022-01-11T09:20:46","date_gmt":"2022-01-11T08:20:46","guid":{"rendered":"https:\/\/www.cff-fiabilite.fr\/?post_type=tribe_events&#038;p=2721"},"modified":"2022-02-08T10:42:41","modified_gmt":"2022-02-08T09:42:41","slug":"powergan-vers-une-filiere-francaise","status":"publish","type":"tribe_events","link":"https:\/\/www.cff-fiabilite.fr\/evenements\/powergan-vers-une-filiere-francaise\/","title":{"rendered":"S\u00e9minaire &#8220;PowerGan : vers une fili\u00e8re fran\u00e7aise&#8221;"},"content":{"rendered":"<p><strong>S\u00e9minaire &#8220;PowerGan : vers une fili\u00e8re fran\u00e7aise\u2019\u2019, le 15 mars 2022<\/strong><\/p>\n<p><strong>Distanciel &amp; pr\u00e9sentiel : Paris, Espace Van Gogh\u00a0<\/strong><strong>62 quai de la Rap\u00e9e 75012 PARIS<\/strong><strong>\u00a0&#8211; M\u00e9tro Gare de Lyon<\/strong><\/p>\n<p>A l\u2019heure ou la maturit\u00e9 technologique est enfin suffisante pour garantir les conditions d\u2019une industrialisation, les IRT Nanoelec (*) et Saint-Exup\u00e9ry et l&#8217;lTE Vedecom proposent de r\u00e9unir l\u2019ensemble de la communaut\u00e9 acad\u00e9mique et industrielle du GaN, pour \u00e9changer sur les th\u00e8mes suivants\u00a0:<\/p>\n<ul>\n<li>Structuration d\u2019une fili\u00e8re \u00e0 l\u2019initiative de STMicroelectronics et des apports du programme d\u00e9di\u00e9 de l\u2019IRT Nanoelec.<\/li>\n<li>Perspectives applicatives et enjeux de R&amp;D<\/li>\n<li>\u00a0Initiatives institutionnelles.<\/li>\n<\/ul>\n<p>Plus d&#8217;informations et inscription : https:\/\/bit.ly\/3slU0qi<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>S\u00e9minaire &#8220;PowerGan : vers une fili\u00e8re fran\u00e7aise\u2019\u2019, le 15 mars 2022 Distanciel &amp; pr\u00e9sentiel : Paris, Espace Van Gogh\u00a062 quai de la Rap\u00e9e 75012 PARIS\u00a0&#8211; M\u00e9tro Gare de Lyon A [&hellip;]<\/p>\n","protected":false},"author":15,"featured_media":2881,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","_tribe_events_status":"","_tribe_events_status_reason":"","footnotes":""},"tags":[],"tribe_events_cat":[97],"acf":[],"_links":{"self":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/2721"}],"collection":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events"}],"about":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/types\/tribe_events"}],"author":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/users\/15"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/comments?post=2721"}],"version-history":[{"count":2,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/2721\/revisions"}],"predecessor-version":[{"id":2727,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/2721\/revisions\/2727"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media\/2881"}],"wp:attachment":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media?parent=2721"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tags?post=2721"},{"taxonomy":"tribe_events_cat","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events_cat?post=2721"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}