{"id":2519,"date":"2021-11-04T10:09:40","date_gmt":"2021-11-04T09:09:40","guid":{"rendered":"https:\/\/www.cff-fiabilite.fr\/?post_type=tribe_events&p=2519"},"modified":"2021-12-02T14:38:14","modified_gmt":"2021-12-02T13:38:14","slug":"fiabilite-des-convertisseurs-delectronique-de-puissance-dans-un-pcb","status":"publish","type":"tribe_events","link":"https:\/\/www.cff-fiabilite.fr\/evenements\/fiabilite-des-convertisseurs-delectronique-de-puissance-dans-un-pcb\/","title":{"rendered":"RDV Fiabilit\u00e9 du CFF \u2013 Novembre 2021 – Fiabilit\u00e9 des convertisseurs d\u2019\u00e9lectronique de puissance dans un PCB"},"content":{"rendered":"

Intervenant<\/b> : Mr Sa\u00efd BENSEBAA, du Laboratoire SATIE<\/p>\n

Description :<\/strong>
\n1\/ Elaboration de nouvelles technologies d\u2019int\u00e9gration de composant de puissance dans du PCB
\n2\/ Estimation de la dur\u00e9e de vie des composants de puissance sous contraintes thermo\u00e9lectriques. (Tests de vieillissement acc\u00e9l\u00e9r\u00e9s, \u00e0 travers du cyclage thermique actif et passif).
\n3\/ Caract\u00e9risation thermom\u00e9canique \u00e0 travers d\u2019essais exp\u00e9rimentaux.
\n4\/ Mod\u00e9lisation multiphysique pour l’estimation des contraintes thermo-\u00e9lectro-m\u00e9canique dans les packagings PCB.<\/p>\n

Acc\u00e8s gratuit en visioconf\u00e9rence (13h00 – 14h00), ouvert \u00e0 tous.
\nVisio-conf\u00e9rences WebEx | 13h00 \u2013 14h00 | Dur\u00e9e : 1h<\/strong>
\n\u2022 30min de pr\u00e9sentation d\u2019une th\u00e8se par le doctorant
\n\u2022 30min d\u2019\u00e9changes sur les suites possibles \/ recommandations<\/p>\n

Support \u00e0 t\u00e9l\u00e9charger\u00a0<\/a><\/strong><\/p>\n

Inscription obligatoire : <\/strong>lien<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

Intervenant : Mr Sa\u00efd BENSEBAA, du Laboratoire SATIE Description : 1\/ Elaboration de nouvelles technologies d\u2019int\u00e9gration de composant de puissance dans du PCB 2\/ Estimation de la dur\u00e9e de vie […]<\/p>\n","protected":false},"author":122,"featured_media":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","_tribe_events_status":"","_tribe_events_status_reason":"","footnotes":""},"tags":[],"tribe_events_cat":[96],"acf":[],"_links":{"self":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/2519"}],"collection":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events"}],"about":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/types\/tribe_events"}],"author":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/users\/122"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/comments?post=2519"}],"version-history":[{"count":7,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/2519\/revisions"}],"predecessor-version":[{"id":2654,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/2519\/revisions\/2654"}],"wp:attachment":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media?parent=2519"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tags?post=2519"},{"taxonomy":"tribe_events_cat","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events_cat?post=2519"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}